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Titre :
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Advanced microwave and millimeter-wave detectors
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Auteurs :
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S. Udpa ;
Advanced microwave and millimeter-wave detectors, San Diego, CA, 25-26 juillet 1994 (1994; USA) ;
H. Han
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Type de document :
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congrès/colloque
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Editeur :
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Washington, USA : Spie, 1994
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Collection :
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SPIE Proceedings Series, vol. 2275
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Format :
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310 p.
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Note générale :
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Sigle : SPIE
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Langues:
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= Anglais
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Catégories :
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METROLOGIE
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Mots-clés:
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MICROONDE
;
RADAR
;
CAPTEUR
;
MATERIAU
;
REFLECTOMETRIE
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Résumé :
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The papers presented at the conference cover a fairly wide range of topics in the field. Two sessions were devoted to applications in the area of nondestructive testing. Following the first paper that reviewed some of the current approaches that employ fixed probe arrays and that are based on nonlinear inverse scattering or neural network methods, papers on newly developed systems and algorithms, as well as modeling techniques for detecting flaws or extracting medium parameters, were included. The third session on microwave imaging and ground-penetrating radar was mainly concerned with the modeling and system aspects of probing radar implementations. The final session encompassed several new imaging and measuring techniques with papers on pulse detection, surface and volume scatterer modeling and imaging, and biomedical applications.
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