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Titre :
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Atomic force microscope studies of membranes : force measurement and imaging in electrolyte solutions
|
|
Auteurs :
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W. Bowen ;
N. Hilal ;
AL Et
|
|
Type de document :
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article/chapitre/communication
|
|
Année de publication :
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1997
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|
Format :
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p.77-89
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Langues:
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= Anglais
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Catégories :
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CHIMIE
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Mots-clés:
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MEMBRANE
;
ULTRAFILTRATION
;
CHLORURE DE SODIUM
;
RESISTANCE DES MATERIAUX
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Résumé :
|
An atomic force microscope has been used to study the electrical double layer interactions between a silicon tip (with an oxidised surface) and two polymeric membranes, one microfiltration (nominally 0.1 mu m) and the other ultrafiltration (25 000 MWCO), in aqueous NaCl solutions. Force-distance curves were measured for the two membranes at four ionic strengths. The membranes were also imaged under the same conditions using electrical double layer repulsive forces of differing magnitudes - 'electrical double layer mode' imaging. Image analysis was used to determine surface pore size distributions. The force-distance curves, together with numerically calculated potential profiles at the entrance to a charged pore, allow an explanation and identification of the optimum imaging conditions. The best images were obtained at high ionic strength with the tip close to the membrane surface.
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Source :
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Journal of membrane science, vol 126
|
