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S. Udpa ; Advanced microwave and millimeter-wave detectors, San Diego, CA, 25-26 juillet 1994 (1994; USA) ; H. Han | Washington, USA : Spie | SPIE Proceedings Series, vol. 2275 | 1994The papers presented at the conference cover a fairly wide range of topics in the field. Two sessions were devoted to applications in the area of nondestructive testing. Following the first paper that reviewed some of the current approaches that[...]
